Acta Optica Sinica, Volume. 42, Issue 10, 1012002(2022)

Radiation Standard Transfer in 232--400 nm Band Based on Solar Blind Filter Radiometer

Jiawei Li1,2、*, Hongyao Chen1、**, Liming Zhang1, Wenxin Huang1, and Xiaolong Si1
Author Affiliations
  • 1Key Laboratory of Optical Calibration and Characterization, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei 230031, Anhui, China
  • 2University of Science and Technology of China, Hefei 230026, Anhui, China
  • show less
    Figures & Tables(17)
    Measurement principle of ultraviolet radiometer
    Flow chart of ultraviolet standard transmission
    Measurement of out-of-band leakage of tungsten halogen lamp light source by using 280 nm channel
    Measurement of halogen tungsten lamp light source of using 280 nm channel by solar blind phototube ultraviolet radiometer
    Schematic diagram of photodetector substitution method with monitor
    Measuring devices for spectral flux responsivity
    Physical drawing of ultraviolet optical path
    Physical drawings of standard detector and phototube assembly
    Relative spectral flux responsivity of each channel
    Calibration of spectral irradiance responsivity by using 300 nm channel
    Comparison result between ultraviolet filter radiometer and standard detector
    Radiance result of ultraviolet integrating sphere
    • Table 1. Parameters of R6800U-11 phototube

      View table

      Table 1. Parameters of R6800U-11 phototube

      ParameterDescription
      Spectral range /nm160--350
      PhotocathodeCs-Te
      Ambient temperature /℃-80--50
      Diameter of photocathode area /mm8
      Radiant sensitivity /(A·W-1)20 mA@250 nmand 25 ℃
      Dark current /pA1
      Recommended operating voltage /V15
    • Table 2. Parameters of Newport-918D standard detector

      View table

      Table 2. Parameters of Newport-918D standard detector

      ParameterDescription
      Spectral range /μm0.2--1.1
      Calibration uncertainty4%@200--219 nm2%@220--349 nm1%@350--949 nm4%@950--1100 nm
      Linearity /%±0.5
      MaterialSilicon-ultraviolet enhanced
      Active area /cm21
      Active diameter /cm1.13
      ShapeCylinder
    • Table 3. Spectral irradiance values of standard lamp (k=2)

      View table

      Table 3. Spectral irradiance values of standard lamp (k=2)

      Wavelength /nmSpectral irradiance /(μW·cm-2·nm-1)Measurementuncertainty /%
      2500.01502.10
      2600.02541.80
      2700.04271.70
      2800.06791.60
      2900.10301.40
      3000.15001.30
      3100.21401.30
      3200.29601.30
      3300.39701.20
      3400.52601.20
      3500.67501.20
      3600.85901.10
      37010.70001.10
      38013.10001.10
      39015.80001.10
      40019.10001.10
      45039.30000.99
    • Table 4. Measurement uncertainty of absolute spectral responsivity based on irradiance standard lamp

      View table

      Table 4. Measurement uncertainty of absolute spectral responsivity based on irradiance standard lamp

      Influence factorUncertaintyat 280 nm /%Uncertaintyat 300 nm /%Uncertaintyat 320 nm /%Uncertaintyat 340 nm /%Uncertaintyat 365 nm /%Uncertaintyat 380 nm /%Uncertaintyat 300 nm(280--320 nm) /%
      Responsivity of eachchannel of radiometer2.2102.2102.2102.2101.2001.1902.210
      Wavelength uncertaintyof monochromator0.5000.5000.5000.5000.1400.1100.500
      Current measurement0.2000.2000.1000.1000.1000.0300.200
      Standard lamp of spectral irradiance2.1002.1001.1001.1001.1001.1002.100
      Distance measurement (500 mm)0.2000.2000.2000.2000.2000.2000.200
      Repeatability0.4000.4000.4000.4000.4000.4000.400
      Temperature0.0300.0300.0300.0300.0300.0300.030
      Stray light0.5000.5000.5000.5000.5000.5000.500
      Non-linearity0.0100.0100.0100.0100.0100.0100.010
      Wavelength uncertainty0.2400.2100.1900.1600.1400.1100.210
      Bandwidth effect0.0010.0010.0010.0010.0010.0010.001
      Spatial uniformity0.0100.0100.0100.0100.0100.0100.010
      Interpolation0.5700.2700.2700.2700.2700.2700.270
      Aperture area0.0100.0100.0100.0100.0100.0100.010
      Combined standard uncertainty2.3502.3001.4201.4201.3401.3302.300
      Expanded uncertainty (k=2)4.7004.6002.8002.8002.7002.7004.600
    • Table 5. Measurement uncertainty of ultraviolet integrating sphere radiation source

      View table

      Table 5. Measurement uncertainty of ultraviolet integrating sphere radiation source

      Influence factorUncertaintyat 280 nm /%Uncertaintyat 300 nm /%Uncertaintyat 320 nm /%Uncertaintyat 340 nm /%Uncertaintyat 365 nm /%Uncertaintyat 380 nm /%Uncertaintyat 300 nm(280--320 nm) /%
      Responsivity of eachchannel of radiometer2.1702.1702.1702.1702.1002.1002.170
      Standard detector2.0002.0002.0002.0002.0002.0002.000
      Wavelength uncertaintyof monochromator0.5000.5000.5000.5000.5000.5000.500
      Current measurement0.2000.2000.2000.2000.1000.1000.200
      Repeatability0.4000.4000.4000.4000.4000.4000.400
      Integrating sphere system0.9600.8900.8100.7800.6800.6700.780
      Surface nonuniformity0.8100.8100.7200.6900.6800.6700.690
      Angle nonuniformity0.4600.2500.3000.2700.2600.2400.270
      Xenon lamp stability0.2300.2300.2300.2300.2300.2300.230
      Stray light0.5000.5000.500.500.5000.5000.500
      Non-linearity0.0100.0100.0100.0100.0100.0100.010
      Wavelength uncertainty0.2400.2400.2400.2100.1900.1600.210
      Bandwidth effect0.0010.0010.0010.0010.0010.0010.001
      Spatial uniformity0.0100.0100.0100.0100.0100.0100.010
      Interpolation0.5700.5700.5700.2700.2700.2700.570
      Aperture area0.0100.0100.0100.0100.0100.0100.010
      Combined standard uncertainty2.5002.4802.4502.3802.3502.3502.380
      Expanded uncertainty (k=2)5.0005.0004.9004.8004.7004.7004.800
    Tools

    Get Citation

    Copy Citation Text

    Jiawei Li, Hongyao Chen, Liming Zhang, Wenxin Huang, Xiaolong Si. Radiation Standard Transfer in 232--400 nm Band Based on Solar Blind Filter Radiometer[J]. Acta Optica Sinica, 2022, 42(10): 1012002

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Oct. 20, 2021

    Accepted: Dec. 14, 2021

    Published Online: May. 10, 2022

    The Author Email: Li Jiawei (jiawei19@mail.ustc.edu.cn), Chen Hongyao (hychen@aiofm.ac.cn)

    DOI:10.3788/AOS202242.1012002

    Topics