Laser & Optoelectronics Progress, Volume. 58, Issue 11, 1112008(2021)

A Random Two-Step Phase Shift Algorithm Based on Polynomial Fitting Background Light

Jing Li1, Ailing Tian1、*, Dasen Wang2, Bingcai Liu1, Xueliang Zhu1, and Hongjun Wang1
Author Affiliations
  • 1Shaanxi Province Key Laboratory of Membrane Technology and Optical Test, School of Optoelectronic Engineering, Xi′an Technology University, Xi′an, Shaanxi 710021, China
  • 2Inner Mongolia Metal Material Research Institute, Ningbo , Zhejiang 315103, China
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    Figures & Tables(13)
    Numerical simulation flow chart
    Initial setting values. (a) Initial wave surface to be measured; (b) background light; (c) modulation
    Background light with different K values. (a) Estimated values; (b) relative residual error
    Background light at K = 5. (a) Estimated values; (b) relative residual error
    Results of the surface shape at K=5. (a) Fitting surface shape; (b) surface shape residual error
    Surface shape results with different methods. (a) PV values of surface shape residual error; (b) RMS values of surface shape residual error
    Phase shift interferograms. (a) b=0.01, δ=0; (b) b=0.01, δ=π/4; (c) b=0.15, δ=0; (d) b=0.15, δ=π/4
    Relationship between illumination nonuniformity coefficient b and surface shape residual error
    Surface shape residual error of the analog interferogram after phase recovery under different noise intensities with different methods. (a) PV values; (b) RMS values
    • Table 1. Standard deviation of background light relative residual error

      View table

      Table 1. Standard deviation of background light relative residual error

      K01234567
      Standard deviation0.3940.3240.0490.0480.0430.0250.0390.052
    • Table 2. Results of the algorithm

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      Table 2. Results of the algorithm

      K01234567
      δK/π0.16790.16580.24800.24930.24970.25070.25030.2496
      ΔδK/π0.08210.08420.00200.00070.00030.00070.00030.0004
      Fitting surface shape PV/λ1.79111.79492.04502.04642.03432.03762.03792.0351
      Fitting surface shape RMS/λ0.30800.34860.41610.41610.41590.41590.41610.4159
      Surface shape residual error PV/λ1.84461.41640.01440.01400.01350.00940.01240.0171
      Surface shape residual error RMS/λ0.31510.20900.00140.00150.00180.00130.00180.0023
      Time/min0.0060.0480.1910.5241.2952.6294.9439.702
    • Table 3. Comparsion of the operation time of phase recovery and surface shape residual error of analog interferograms with different pixel number

      View table

      Table 3. Comparsion of the operation time of phase recovery and surface shape residual error of analog interferograms with different pixel number

      Image size /(pixel×pixel)Time /minSurface shape residual error PV/λSurface shape residual error RMS/λ
      200×2000.6310.01100.0016
      500×5005.0270.00810.0011
      800×80024.6770.01180.0014
    • Table 4. Results of PFBL and GS algorithms under different phase shifts

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      Table 4. Results of PFBL and GS algorithms under different phase shifts

      Theoretical value of phase shift/π0.10.20.30.40.50.60.7
      PFBLEstimated value of phase shift/π0.10030.20050.30080.40080.50060.59910.6993
      Residual error of phase shift/π0.00030.00050.00080.00080.00060.00090.0007
      Time/min2.772.662.752.762.732.712.63
      GSEstimated value of phase shift/π0.12260.21970.29020.38580.48250.58690.6845
      Residual error of phase shift/π0.02260.01970.00980.01420.01750.01310.0155
      Time/min5.435.335.475.385.455.425.36
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    Jing Li, Ailing Tian, Dasen Wang, Bingcai Liu, Xueliang Zhu, Hongjun Wang. A Random Two-Step Phase Shift Algorithm Based on Polynomial Fitting Background Light[J]. Laser & Optoelectronics Progress, 2021, 58(11): 1112008

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Nov. 5, 2020

    Accepted: Dec. 14, 2020

    Published Online: Jun. 7, 2021

    The Author Email: Ailing Tian (ailintian@xatu.edu.cn)

    DOI:10.3788/LOP202158.1112008

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