Laser & Optoelectronics Progress, Volume. 58, Issue 11, 1112008(2021)
A Random Two-Step Phase Shift Algorithm Based on Polynomial Fitting Background Light
Fig. 2. Initial setting values. (a) Initial wave surface to be measured; (b) background light; (c) modulation
Fig. 3. Background light with different K values. (a) Estimated values; (b) relative residual error
Fig. 4. Background light at K = 5. (a) Estimated values; (b) relative residual error
Fig. 5. Results of the surface shape at K=5. (a) Fitting surface shape; (b) surface shape residual error
Fig. 6. Surface shape results with different methods. (a) PV values of surface shape residual error; (b) RMS values of surface shape residual error
Fig. 7. Phase shift interferograms. (a) b=0.01, δ=0; (b) b=0.01, δ=π/4; (c) b=0.15, δ=0; (d) b=0.15, δ=π/4
Fig. 8. Relationship between illumination nonuniformity coefficient b and surface shape residual error
Fig. 9. Surface shape residual error of the analog interferogram after phase recovery under different noise intensities with different methods. (a) PV values; (b) RMS values
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Jing Li, Ailing Tian, Dasen Wang, Bingcai Liu, Xueliang Zhu, Hongjun Wang. A Random Two-Step Phase Shift Algorithm Based on Polynomial Fitting Background Light[J]. Laser & Optoelectronics Progress, 2021, 58(11): 1112008
Category: Instrumentation, Measurement and Metrology
Received: Nov. 5, 2020
Accepted: Dec. 14, 2020
Published Online: Jun. 7, 2021
The Author Email: Ailing Tian (ailintian@xatu.edu.cn)