The thickness uniformity of the coating is of great importance to the coating preparation. It not only determines the coating area, but also influences various properties of the coating[
Chinese Optics Letters, Volume. 13, Issue Suppl., S22201(2015)
Theoretical study of the thickness uniformity of a coating on the inner face of a parabolic substrate in a vacuum evaporation system
The theoretical study of the film thickness distribution deposited on a parabolic substrate by vacuum evaporation is reported. It is derived that the value of
The thickness uniformity of the coating is of great importance to the coating preparation. It not only determines the coating area, but also influences various properties of the coating[
The theoretical study of the thickness uniformity of the coating deposited on a parabolic substrate with an evaporation source below the substrate is illustrated in this Letter. First, we deduce the coating thickness equation of an arbitrary point on the parabolic substrate and the coating area when the substrate is stationary. Then the coating thickness equation of an arbitrary point on the parabolic substrate is calculated when it is rotating along the vertical axis. Finally, we analyze the coating thickness distribution on the parabolic substrate by calculating the relative thickness of different heights and the vertex. Two kinds of the most common evaporation sources are the point source and the small surface source.
The configuration of the source-substrate system in the coating preparation on a parabolic substrate is shown in Fig.
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Figure 1.Configuration of source-substrate system in the film growth on parabolic substrate.
When the substrate is stationary, the arbitrary point
The distance
The angle
The emission angle
When the source is a surface source, the density of the vapor around it has a certain direction and the film thickness follows a cosine distribution. The film thickness
Obviously, some areas cannot be coated when
When the substrate is stationary, the coating area is the part facing the evaporation source divided by the plane
Under the situation that the substrate is rotating, some areas cannot be coated when
As a result of the symmetry of the parabolic substrate, the film thickness is uniform at the same height. The film thickness at different heights deposited by a point source and a surface source can be expressed as
With Eqs. (
The coating thickness equation of each point on a parabolic substrate is shown in Eqs. (
Figure 2.Coated arc of the circle
The coating thickness distribution can be studied by calculating the relative thickness of the different heights and the vertex on the parabolic substrate. Based on Eq. (
Additionally, when
Figure
Figure 3.With
Figure
Figure 4.Impact of
It can be seen that an excellent thickness uniformity of coating on a whole parabolic substrate can be obtained by choosing an appropriate configuration of an evaporation system under different evaporation sources. However, the requirement for the configuration of an evaporation system is quite rigorous and it is difficult to achieve. Under actual situations it is necessary to use some actions such as a modified plate and planetary rotation to improve the film thickness uniformity[
In conclusion, it is believed that by choosing the appropriate configuration of an evaporation system, a relatively homogeneous coating can be obtained on the whole inner face of the parabolic substrate. This study provides a theoretical basis for the improvement of thickness uniformity of coatings on parabolic substrates. Moreover, it has theoretical guiding significance for coating preparation on complex surface substrates. Meanwhile, a parabolic reflector with good uniformity definitely can be fabricated if it is supplemented by other means such as a correcting plate and planetary rotation.
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Lingmao Xu, Jizhou Wang, Maojin Dong, Duoshu Wang, Yudong Feng, "Theoretical study of the thickness uniformity of a coating on the inner face of a parabolic substrate in a vacuum evaporation system," Chin. Opt. Lett. 13, S22201 (2015)
Category: Optical Design and Fabrication
Received: Apr. 29, 2015
Accepted: Jul. 9, 2015
Published Online: Aug. 8, 2018
The Author Email: Jizhou Wang (13919878241@139.com)