Opto-Electronic Engineering, Volume. 38, Issue 8, 90(2011)
Defect Detection Based on Wavelet Multi-scale Products and Morphology
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CUI Ling-ling, LU Zhao-yang, LI Jing, LI Yi-hong. Defect Detection Based on Wavelet Multi-scale Products and Morphology[J]. Opto-Electronic Engineering, 2011, 38(8): 90
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Received: Nov. 29, 2010
Accepted: --
Published Online: Aug. 24, 2011
The Author Email: Ling-ling CUI (llcuisx@gmail.com)
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