[1] [1] J. Miao, C. Charalambous, J. Kirz, and D. Sayre, Nature 400, 342 (1999).

[2] [2] U. Weierstall, Q. Chen, J. Spence, M. Howells, M. Isaacson, and R. Panepucci, Ultramicroscopy 90, 171 (2001).

[3] [3] J. R. Fienup, Appl. Opt. 21, 2758 (1982).

[4] [4] J. Spence, U. Weierstall, and M. Howells, Philos. Trans. 360, 875 (2002).

[5] [5] H. He, S. Marchesini, M. Howells, U. Weierstall, G. Hembree, and J. C. H. Spence, Acta. Cryst. A 59, 143 (2003).

[6] [6] D. Shapiro, P. Thibault, T. Beetz, V. Elser, M. Howells, C. Jacobsen, J.Kirz, E. Lima, H. Miao, A. M. Neiman, and D. Sayre, Proc. Natl. Acad. Sci. USA 102, 15343 (2005).

[7] [7] M. A. Pfeifer, G. J. Williams, I. A. Vartanyants, R. Harder, and I. K. Robinson, Nature 442, 63 (2006).

[8] [8] H. N. Chapman, A. Barty, S. Marchesini, A. Noy, S. P. Hau-Riege, C. Cui, M. R. Howells, R. Rosen, H. He, J. C. H. Spence, U. Weierstall, T. Beetz, C. Jacobsen, and D. Shapiro, J. Opt. Soc. Am. A 23, 1179 (2006).

[9] [9] J. M. Rodenburg, Adv. Imag. Electron. Phys. 150, 87 (2008).

[10] [10] J. M. Rodenburg, A. Hurst, and A. Cullis, Ultramicroscopy 107, 227 (2007).

[11] [11] J. M. Rodenburg, A. C. Hurst, A. G. Cullis, B. R. Dobson, F. Pfeiffer, O. Bunk, C. David, K. Jefimovs, and I. Johnson, Phys. Rev. Lett. 98, 034801 (2007).

[12] [12] A. M. Maiden and J. M. Rodenburg, Ultramicroscopy 109, 1256 (2009).