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Chinese Journal of Lasers, Volume. 22, Issue 10, 757(1995)

Simultaneous Measurement of Profiles of the Stable-state Photoconductive Response and Minority Carrier Lifetime Using Two Semicondutor Lasers

[in Chinese]1, [in Chinese]1, [in Chinese]2, [in Chinese]2, and [in Chinese]2
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Simultaneous Measurement of Profiles of the Stable-state Photoconductive Response and Minority Carrier Lifetime Using Two Semicondutor Lasers[J]. Chinese Journal of Lasers, 1995, 22(10): 757

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    Received: Nov. 4, 1994

    Accepted: --

    Published Online: Aug. 17, 2007

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology