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Journal of Optoelectronics · Laser, Volume. 36, Issue 6, 605(2025)

DeepLabv3++:Fabric defect detection model based on semantic segmentation

PAN Haipeng1,2、*, CHEN Xiaomeng1,2, REN Jia1,2, and ZHOU Chuanhui1
Author Affiliations
  • 1School of Information Science & Engineering, Zhejiang Sci-Tech University, Hangzhou, Zhejiang 310018, China
  • 2Changshan Research Institute Co.Ltd.of Zhejiang Sci-Tech University, Quzhou, Zhejiang 324299, China
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    PAN Haipeng, CHEN Xiaomeng, REN Jia, ZHOU Chuanhui. DeepLabv3++:Fabric defect detection model based on semantic segmentation[J]. Journal of Optoelectronics · Laser, 2025, 36(6): 605

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    Received: Jan. 24, 2024

    Accepted: Jun. 24, 2025

    Published Online: Jun. 24, 2025

    The Author Email: PAN Haipeng (pan@zstu.edu.cn)

    DOI:10.16136/j.joel.2025.06.0057

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology