Journal of Optoelectronics · Laser, Volume. 36, Issue 6, 605(2025)

DeepLabv3++:Fabric defect detection model based on semantic segmentation

PAN Haipeng1,2、*, CHEN Xiaomeng1,2, REN Jia1,2, and ZHOU Chuanhui1
Author Affiliations
  • 1School of Information Science & Engineering, Zhejiang Sci-Tech University, Hangzhou, Zhejiang 310018, China
  • 2Changshan Research Institute Co.Ltd.of Zhejiang Sci-Tech University, Quzhou, Zhejiang 324299, China
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    A novel DeepLabv3++ model is proposed to address the low accuracy in identifying small targets and slow detection speed in fabric defect detection tasks. Firstly, a multi-scale lightweight backbone network is designed to extract features from defects with various shapes and sizes. Secondly, convolutional attention modules and channel spatial attention modules are introduced to capture boundary information of small targets and focus on defect regions. Additionally, two types of multi-level feature fusion (MFF) modules are added to mitigate the issue of detail information loss in decoder. Finally, the model is trained and evaluated using a fabric defect dataset collected from an industrial site. The results show that our DeepLabv3++ model outperforms other models, utilizing only 4.1 million parameters. It achieves a mean intersection over union (mIoU) of 90.01% and a mean pixel accuracy (mPA) of 95.05%, meeting the industrial site requirements for balancing detection precision and processing speed.

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    PAN Haipeng, CHEN Xiaomeng, REN Jia, ZHOU Chuanhui. DeepLabv3++:Fabric defect detection model based on semantic segmentation[J]. Journal of Optoelectronics · Laser, 2025, 36(6): 605

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    Paper Information

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    Received: Jan. 24, 2024

    Accepted: Jun. 24, 2025

    Published Online: Jun. 24, 2025

    The Author Email: PAN Haipeng (pan@zstu.edu.cn)

    DOI:10.16136/j.joel.2025.06.0057

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