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Laser & Optoelectronics Progress, Volume. 57, Issue 8, 081012(2020)

Local Style Migration Method Based on Residual Neural Network

Jinguang Sun and Xinsong Liu*
Author Affiliations
  • School of Electronic and Information Engineering, Liaoning Technical University, Huludao, Liaoning 125105, China
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    AbstractGet PDF(in Chinese)
    Figures&Tables (8)
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    References (21)
    Cited By (1)
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    Figures & Tables(8)
    Local style migration network model

    Fig. 1. Local style migration network model

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    Mask effect maps

    Fig. 2. Mask effect maps

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    VGG network architecture

    Fig. 3. VGG network architecture

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    Residual network schematic

    Fig. 4. Residual network schematic

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    Experimental results

    Fig. 5. Experimental results

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    Weight diagrams of content and style

    Fig. 6. Weight diagrams of content and style

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    Generation effect of different layers

    Fig. 7. Generation effect of different layers

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    • Table 1. Time comparisons

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      Table 1. Time comparisons

      Method256×256512×5121024×1024
      Ref. [1]14.32751.192200.354
      Ref. [2]0.0140.0450.166
      Ref. [21]0.0170.0640.254
      Ref. [4]0.6201.1392.947
      Proposed0.0230.0610.215
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    Jinguang Sun, Xinsong Liu. Local Style Migration Method Based on Residual Neural Network[J]. Laser & Optoelectronics Progress, 2020, 57(8): 081012

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    Paper Information

    Category: Image Processing

    Received: Jul. 30, 2019

    Accepted: Sep. 12, 2019

    Published Online: Apr. 3, 2020

    The Author Email: Xinsong Liu (song_0501qq.com@foxmail.com)

    DOI:10.3788/LOP57.081012

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology