Optics and Precision Engineering, Volume. 30, Issue 11, 1310(2022)

Mechanism analysis and verification of double-layer micro-nano structure to enhance electromagnetic shielding

Dunwei LIAO1, Yuejun ZHENG1、*, Hao CUI1,2, Tie CUN3, and Yunqi FU1
Author Affiliations
  • 1College of Electronic Science, National University of Defense Technology, Changsha40073, China
  • 2Shenyang Aircraft Design and Research Institute, Shenyang110000, China
  • 3Zhongwei United Innovation (Pingtan) Engineering Research Co., Ltd., Fuzhou50000, China
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    Dunwei LIAO, Yuejun ZHENG, Hao CUI, Tie CUN, Yunqi FU. Mechanism analysis and verification of double-layer micro-nano structure to enhance electromagnetic shielding[J]. Optics and Precision Engineering, 2022, 30(11): 1310

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    Paper Information

    Category: Micro/Nano Technology and Fine Mechanics

    Received: Mar. 1, 2022

    Accepted: --

    Published Online: Jul. 4, 2022

    The Author Email: Yuejun ZHENG (zhengyuejun18@nudt.edu.cn)

    DOI:10.37188/OPE.20223000.0085

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