Electron-beam-induced degradation of halide-perovskite-related semiconductor nanomaterials

Zhiya Dang; Yuqing Luo; Xue-Sen Wang; Muhammad Imran; Pingqi Gao

doi:10.3788/COL202119.030002

Chinese Optics Letters, Volume. 19, Issue 3, 030002(2021)

Electron-beam-induced degradation of halide-perovskite-related semiconductor nanomaterials

Zhiya Dang^1、*, Yuqing Luo¹, Xue-Sen Wang², Muhammad Imran³, and Pingqi Gao^1、**

Author Affiliations

¹School of Materials, Sun Yat-sen University, Guangzhou 510006, China

²Department of Physics, National University of Singapore, Singapore 117551, Singapore

³Department of Nanochemistry, Istituto Italiano di Tecnologia, Via Morego 30, Genova 16163, Italy

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Zhiya Dang, Yuqing Luo, Xue-Sen Wang, Muhammad Imran, Pingqi Gao, "Electron-beam-induced degradation of halide-perovskite-related semiconductor nanomaterials," Chin. Opt. Lett. 19, 030002 (2021)

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Paper Information

Category: Special Issue on Metal Halide Perovskite and Their Applications

Received: Nov. 17, 2020

Accepted: Jan. 5, 2021

Published Online: Feb. 22, 2021

The Author Email: Zhiya Dang (dangzhy3@mail.sysu.edu.cn), Pingqi Gao (gaopq3@mail.sysu.edu.cn)

DOI:10.3788/COL202119.030002

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology