Acta Optica Sinica, Volume. 43, Issue 23, 2330002(2023)
Terahertz Time-Domain Spectroscopy Characterization Method for Mechanical Properties of Organic Silicone
Fig. 1. Schematic diagrams of terahertz stress measurement system. (a) Transmission type; (b) reflection type
Fig. 5. Relationship between refractive index and terahertz frequency under different stress
Fig. 6. Relationship between refractive index difference and stress at different frequencies
Fig. 7. Relationship between phase difference and terahertz frequency under different stress state
Fig. 8. Relationship between phase difference and stress at different frequencies
Fig. 9. Sample to be tested and terahertz time-domain reflection spectrogram. (a) Sample to be tested; (b) terahertz time-domain reflection spectrogram
Fig. 10. Terahertz time-domain spectrograms under stress. (a) Film thickness is 2 mm; (b) film thickness is 3 mm
Fig. 11. Relationship between time delay difference and stress. (a) Film thickness is 2 mm; (b) film thickness is 3 mm
Fig. 12. Relationship between time delay difference and stress. (a) Film thickness is 2 mm; (b) film thickness is 3 mm
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Ye Wang, Chuang Liu, Jiaojiao Ren, Tao Liu, Dandan Zhang, Lijuan Li. Terahertz Time-Domain Spectroscopy Characterization Method for Mechanical Properties of Organic Silicone[J]. Acta Optica Sinica, 2023, 43(23): 2330002
Category: Spectroscopy
Received: Sep. 20, 2023
Accepted: Oct. 10, 2023
Published Online: Dec. 12, 2023
The Author Email: Liu Chuang (liuchuang@cust.edu.cn)