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Laser & Optoelectronics Progress, Volume. 49, Issue 9, 91404(2012)

Long-Term Aging and Failure Analysis for 980 nm Laser Diodes

Liu Bin1、*, Liu Yuanyuan2, and Cui Bifeng3
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    Article index updated: Mar. 14, 2025

    The article is cited by 6 article(s) CLP online library. (Some content might be in Chinese.)
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    Liu Bin, Liu Yuanyuan, Cui Bifeng. Long-Term Aging and Failure Analysis for 980 nm Laser Diodes[J]. Laser & Optoelectronics Progress, 2012, 49(9): 91404

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    Paper Information

    Category: Lasers and Laser Optics

    Received: Mar. 5, 2012

    Accepted: --

    Published Online: Jul. 13, 2012

    The Author Email: Bin Liu (rays_liu@126.com)

    DOI:10.3788/lop49.091404

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology