Fig. 1. (a) Schematic diagram of light scattering from a silicon hollow nanodisk illuminated by a focused RP beam. (b) Geometry of the hollow nanodisk.

Fig. 2. Scattering spectrum of the hollow nanodisk at the position of (a) x=0nm and (b) x=220nm as a function of the incident wavelength, respectively. The green dashed lines denote the result of the overlapping of TED and MD.

Fig. 3. (a) Relative amplitude and (b) phase difference between Dz and my for the different lateral displacements.

Fig. 4. (a) 3D radiation pattern and (b) polar plot of the scattering field for the wavelength of 1030 nm when x=0nm. (c) 3D radiation pattern for the wavelength of 1030 nm when x=220nm. (d) Polar plots of the scattering field for different wavelengths when x=220nm, 250 nm, 280 nm, 315 nm, 340 nm, and 355 nm, respectively. The solid dots and lines in (b) and (d) give the results obtained by FDTD simulation and the theoretical model, including the overlapping of TED and MD, respectively.

Fig. 5. Far-field scattering for different lateral displacements at the wavelength of (a) 1030 nm and (b) 875 nm in the xz plane, respectively. (c) The variations of lateral directivity as a function of lateral displacement for different wavelengths.