Journal of Infrared and Millimeter Waves, Volume. 43, Issue 4, 490(2024)
Application of principal component analysis and clustering methods in the discrimination of parameters in HgCdTe crystals
Fig. 2. Electrical resistivity at 300 K as a function of composition
Fig. 7. Score plot of first principal component versus second principal component
Fig. 8. Cluster plot after DBSCAN clustering algorithm on original data
Fig. 9. Principal component plot of high-quality long-wave and mid-wave materials
Fig. 10. Discriminant ellipse plot of high-quality long-wave materials
Fig. 11. Discriminant ellipse plot of high-quality mid-wave materials
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Jia-Hao WU, Hui QIAO, Xiang-Yang LI. Application of principal component analysis and clustering methods in the discrimination of parameters in HgCdTe crystals[J]. Journal of Infrared and Millimeter Waves, 2024, 43(4): 490
Category: Research Articles
Received: Dec. 13, 2023
Accepted: --
Published Online: Aug. 27, 2024
The Author Email: Xiang-Yang LI (lixy@mail.sitp.ac.cn)