Journal of Infrared and Millimeter Waves, Volume. 43, Issue 4, 490(2024)

Application of principal component analysis and clustering methods in the discrimination of parameters in HgCdTe crystals

Jia-Hao WU1,2, Hui QIAO1, and Xiang-Yang LI1、*
Author Affiliations
  • 1Shanghai Institute of Technical Physics,Chinese Academy of Sciences,Shanghai 200083,China
  • 2School of Information Science and Technology,ShanghaiTech University,Shanghai 201210,China
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    Figures & Tables(11)
    Electron concentration at 300 K for Hg1-xCdxTe materials
    Electrical resistivity at 300 K as a function of composition
    Electron concentration at 77 K for Hg1-xCdxTe materials
    Electrical resistivity at 77 K for Hg1-xCdxTe materials
    Transmissivity for Hg1-xCdxTe materials
    Cumulative variance plot of principal components
    Score plot of first principal component versus second principal component
    Cluster plot after DBSCAN clustering algorithm on original data
    Principal component plot of high-quality long-wave and mid-wave materials
    Discriminant ellipse plot of high-quality long-wave materials
    Discriminant ellipse plot of high-quality mid-wave materials
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    Jia-Hao WU, Hui QIAO, Xiang-Yang LI. Application of principal component analysis and clustering methods in the discrimination of parameters in HgCdTe crystals[J]. Journal of Infrared and Millimeter Waves, 2024, 43(4): 490

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    Paper Information

    Category: Research Articles

    Received: Dec. 13, 2023

    Accepted: --

    Published Online: Aug. 27, 2024

    The Author Email: Xiang-Yang LI (lixy@mail.sitp.ac.cn)

    DOI:10.11972/j.issn.1001-9014.2024.04.008

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