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Chinese Optics Letters, Volume. 18, Issue 9, 092501(2020)

Photonic-assisted single system for microwave frequency and phase noise measurement Editors' Pick

Jingzhan Shi, Fangzheng Zhang*, De Ben, and Shilong Pan
Author Affiliations
  • Key Laboratory of Radar Imaging and Microwave Photonics, Ministry of Education, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, China
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    Article index updated: Aug. 12, 2025

    Citation counts are provided from Web of Science. The counts may vary by service, and are reliant on the availability of their data.
    The article is cited by 12 article(s) from Web of Science.
    The article is cited by 1 article(s) CLP online library. (Some content might be in Chinese.)
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    Jingzhan Shi, Fangzheng Zhang, De Ben, Shilong Pan, "Photonic-assisted single system for microwave frequency and phase noise measurement," Chin. Opt. Lett. 18, 092501 (2020)

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    Paper Information

    Category: Optoelectronics

    Received: Mar. 21, 2020

    Accepted: May. 15, 2020

    Posted: May. 15, 2020

    Published Online: Jul. 24, 2020

    The Author Email: Fangzheng Zhang (zhangfangzheng@nuaa.edu.cn)

    DOI:10.3788/COL202018.092501

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology