Photonics Research, Volume. 8, Issue 2, 219(2020)
Fabrication-tolerant Fourier transform spectrometer on silicon with broad bandwidth and high resolution
[18] A. Li, Y. Xing, R. Van Laer, R. Baets, W. Bogaerts. Extreme spectral transmission fluctuations in silicon nanowires induced by backscattering. 13th International Conference on Group IV Photonics (GFP), 160-161(2016).
Get Citation
Copy Citation Text
Ang Li, Jordan Davis, Andrew Grieco, Naif Alshamrani, Yeshaiahu Fainman, "Fabrication-tolerant Fourier transform spectrometer on silicon with broad bandwidth and high resolution," Photonics Res. 8, 219 (2020)
Category: Silicon Photonics
Received: Oct. 2, 2019
Accepted: Dec. 16, 2019
Published Online: Feb. 10, 2020
The Author Email: Ang Li (angli@ucsd.edu)