Opto-Electronic Engineering, Volume. 43, Issue 11, 1(2016)

Error Analysis of the Loss Measurement of Super High Reflectivity Components Using Continuous CRD Technique

CUI Hao1,2, LI Bincheng1,2, HAN Yanling1, GAO Chunming2, and WANG Yafei2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less
    Figures & Tables(0)
    Tools

    Get Citation

    Copy Citation Text

    CUI Hao, LI Bincheng, HAN Yanling, GAO Chunming, WANG Yafei. Error Analysis of the Loss Measurement of Super High Reflectivity Components Using Continuous CRD Technique[J]. Opto-Electronic Engineering, 2016, 43(11): 1

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Apr. 26, 2016

    Accepted: --

    Published Online: Dec. 9, 2016

    The Author Email:

    DOI:10.3969/j.issn.1003-501x.2016.11.001

    Topics