Multi-Filament Interaction Induced Breakdown Spectroscopy for Trace Element Detection in Soil

Yu Qiao; Mengyun Hu; Jinman Ge; Fangfang Li; Shupeng Xu; Ming Yan; Xiaojun Li; Heping Zeng

doi:10.3788/CJL221538

Chinese Journal of Lasers, Volume. 50, Issue 7, 0708009(2023)

Multi-Filament Interaction Induced Breakdown Spectroscopy for Trace Element Detection in Soil

Yu Qiao¹, Mengyun Hu^1,2,3、*, Jinman Ge⁴, Fangfang Li^1,2, Shupeng Xu^1,2, Ming Yan^1,2, Xiaojun Li⁴, and Heping Zeng^1,2

Author Affiliations

¹State Key Laboratory of Precision Spectroscopy, East China Normal University, Shanghai 200062, China

²Chongqing Key Laboratory of Precision Optics, Chongqing Institute, East China Normal University, Chongqing 401120, China

³ROI Optoelectronics Technology Co., Ltd., Shanghai 201108, China

⁴National Key Laboratory of Science and Technology on Space Microwave, China Academy of Space Technology (Xi an), Xi an 710100, Shaanxi, China

show less

Abstract Get PDF(in Chinese)

Figures & Tables(8)

Fig. 1. System diagrams. (a) Diagram of experimental setup; (b) schematic of FIBS system; (c) schematic of GIBS system; (d) schematic of TIBS system

Download full size

Fig. 2. Spectral lines of chromium at 425.48, 427.54, and 429.03 nm for different systems

Download full size

Fig. 3. Evolutions of spectral intensity and SNR of Cr I 429.03 nm characteristic peak with detection delay

Download full size

Fig. 4. Cr I 427.54 nm spectral line signals at different sample locations in different systems. (a) FIBS system; (b) GIBS system; (c) TIBS system

Download full size

Fig. 5. Calibration curves of chromium elements in different systems. (a) FIBS system; (b) GIBS system; (c) TIBS system

Download full size

Table 1. Spectral parameters of Cr I lines

View table

Table 1. Spectral parameters of Cr I lines

Position	A_ki /（10⁷ s^-1）	Transition	E_k /cm^-1	J_i	J_k
Cr I 425.48 nm	3.15	3d⁵（⁶S₃）4s→3d⁵（⁶S₄）4p	23498.8156	3	4
Cr I 427.54 nm	3.07	3d⁵（⁶S₃）4s→3d⁵（⁶S₃）4p	23386.3419	3	3
Cr I 429.03 nm	3.16	3d⁵（⁶S₃）4s→3d⁵（⁶S₂）4p	23305.0026	3	2

Table 2. Spectral line signal intensity of FIBS, GIBS, TIBS systems at Cr I 425.48 nm,Cr I 427.54 nm, and Cr I 429.03 nm and signal enhancement among different systems
View table
Table 2. Spectral line signal intensity of FIBS, GIBS, TIBS systems at Cr I 425.48 nm,Cr I 427.54 nm, and Cr I 429.03 nm and signal enhancement among different systems
Position I_FIBS I_GIBS I_TIBS E_GIBS E_TIBS
Cr I 425.48 nm 3785 11355 31565 3.0 2.8
Cr I 427.54 nm 2786 11545 34277 4.1 3.0
Cr I 429.03 nm 3454 13486 42746 3.9 3.2

Table 3. Average relative errors of different systems for testing samples with different chromium contents

View table

Table 3. Average relative errors of different systems for testing samples with different chromium contents

System

Chromium mass fraction of

342×10^-6

Chromium mass fraction of

684×10^-6

Chromium mass fraction of 1368×10^-6

Chromium mass fraction of 2052×10^-6

Chromium mass fraction of 2736×10^-6

Chromium mass fraction of 3420×10^-6

FIBS

2.73

6.55

9.98

6.72

1.88

2.38

GIBS

5.80

3.18

5.42

1.84

3.17

2.26

TIBS

6.80

1.68

1.08

0.94

0.72

0.46

Tools

Get Citation

Copy Citation Text

Yu Qiao, Mengyun Hu, Jinman Ge, Fangfang Li, Shupeng Xu, Ming Yan, Xiaojun Li, Heping Zeng. Multi-Filament Interaction Induced Breakdown Spectroscopy for Trace Element Detection in Soil[J]. Chinese Journal of Lasers, 2023, 50(7): 0708009

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category: nonlinear optics

Received: Dec. 16, 2022

Accepted: Feb. 24, 2023

Published Online: Apr. 14, 2023

The Author Email: Hu Mengyun (myhu@phy.ecnu.edu.cn)

DOI:10.3788/CJL221538

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology

Table 1. Spectral parameters of Cr I lines

Table 1. Spectral parameters of Cr I lines

Table 2. Spectral line signal intensity of FIBS, GIBS, TIBS systems at Cr I 425.48 nm,Cr I 427.54 nm, and Cr I 429.03 nm and signal enhancement among different systems

Table 2. Spectral line signal intensity of FIBS, GIBS, TIBS systems at Cr I 425.48 nm,Cr I 427.54 nm, and Cr I 429.03 nm and signal enhancement among different systems

Table 3. Average relative errors of different systems for testing samples with different chromium contents

Table 3. Average relative errors of different systems for testing samples with different chromium contents