[1] [1] John Graham, Zoran Popovic. Capacitance based scanner for thickness mapping of thin dielectric films[J]. Rev. Sci. Instr., 2000, 71(5): 2219～2223

[2] [2] Chen Lei, Wang Qing, Zhu Rihong. Measurement of the homogeneity of refractive index of the germanium crystal using IR interferometer[J]. Chinese J. Lasers, 2005, 32(3): 404～406

[3] [3] Chung W. Bark, Kyung C. Cho, Yang M. Koo et al.. Two-dimensional mapping of triaxial strain fields in a multiferroic BiFeO3 thin film using scanning x-ray microdiffraction[J]. Appl. Phys. Lett., 2007, 90(10): 102904

[4] [4] Peng Donggong, Wu Yonggang, Jiao Hongfei et al.. Design of narrowband high-reflection filter coating with wide stop band[J]. Acta Optica Sinica, 2008, 28(5): 1001～1006

[5] [5] Wang Zhenhua, Wu Yonggang, Sang Tian et al.. Reflection spectra properties of guided-mode resonance filters with buffer layer[J]. Acta Optica Sinica, 2008, 28(7): 1425～1428

[6] [6] Zhu Jingtao, Zhang Shumin, Wang Bei et al.. SiC/Mg multilayer film reflective mirror at 30.4 nm[J]. Acta Optica Sinica, 2007, 27(4): 735～738

[7] [7] Lü Guonuan, Li Dawei, Huang Jianbing et al.. Design and fabrication of graded reflectivity mirrors[J]. Chinese J. Lasers, 2008, 35(8): 1240～1244

[8] [8] Ma Xiaofeng, Wang Dan, Liu Dingquan et al.. Design of non-polarizing broadband antireflection coating using equivalent layer[J]. Acta Optica Sinica, 2007, 27(3): 563～566

[9] [9] Kuo Meiling, David J. Poxson, Kim Yong Sun et al.. Realization of a near-perfect antireflection coating for silicon solar energy utilization[J]. Opt. Lett. 2008, 33(21): 2527～2529

[10] [10] Pan Yongqiang, Wu Zhensen, Huang Lingxia. Optical thin films interfaces roughness cross-correlated properties and light scattering[J]. Chinese J. Lasers, 2008, 35(6): 916～920

[11] [11] Jonathan Corbet, Alessandro Rubini, Greg Kroah-Hartman. Linux Device Drivers[M]. 1005 Gravenstein Highway North, Sebastopol, CA, USA: O’Reilly Media Inc. 2005. 2～4

[12] [12] Tim Boudreau, Jaroslav Tulach, Geertjan Wielenga. Rich Client Programming: Plugging into the NetBeans Platform[M]. Upper Saddle River, NJ, USA: Prentice Hall. 2007. 39～67

[13] [13] Liu Hengbiao, Chi Jingchun. Analysis of affecting factors on surface roughness measurement based on polychromatic speckle elongation[J]. Acta Optica Sinica. 2008, 28(2): 279～284

[14] [14] Gao Yi, Yang Hongliang, Zhang Fujun et al.. Preparation and optical characteristics of polymer DR13/PMMA composite films[J]. Chinese J. Lasers. 2007, 34(7): 983～987

[15] [15] Chen Dayu, Zhang Rongjun, Zhu Weidan et al.. Study of 100 GHz narrow bandpass DWDM filters in the fiber optical communication[J]. Journal of Infrared and Millimeter Waves, 2003, 22(1): 75～76