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Chinese Journal of Lasers, Volume. 36, Issue 6, 1555(2009)

Design and Realization of Extensive Optical Thin Film Mapping Measurement Platform

Lu Weijie1、*, Zhang Rongjun1, Chen Yiming1, Zheng Yuxiang1, Cheng Xu2, Li Chuanwen2, and Chen Liangyao1
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    An extensive optical thin film mapping measurement platform was designed and realized using the module-based design model. Different types of mapping measurement can be supported by the platform through adding new device modules. The mapping transmittance spectrum of a wavelength-division-multiplex (WDM) filter is successfully measured with the platform.

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    extensitymapping measurement platformmodulethin films
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    Lu Weijie, Zhang Rongjun, Chen Yiming, Zheng Yuxiang, Cheng Xu, Li Chuanwen, Chen Liangyao. Design and Realization of Extensive Optical Thin Film Mapping Measurement Platform[J]. Chinese Journal of Lasers, 2009, 36(6): 1555

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    Paper Information

    Category: materials and thin films

    Received: Oct. 22, 2008

    Accepted: --

    Published Online: Jun. 8, 2009

    The Author Email: Weijie Lu (082021007@fudan.edu.cn)

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology