Infrared Technology, Volume. 43, Issue 1, 1(2021)

Experimental Study on Laser-induced Damage to an Uncooled Microbolometer

Bing ZHOU1、*, Xuan HE2, Hexiong LIU1, Bingxuan LI1, and Junxiang ZHANG2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    References(5)

    [1] [1] Wood R A. Uncooled thermal imaging with monolithic silicon focal planes[J]. Proc. of SPIE on Infrared Technology XIX, 1993, 202: 322-329.

    [2] [2] Kruse P. Uncooled thermal imaging, arrays, systems, and applications[J].

    [6] [6] Fieque B, Tissot J L, Trouilleau C, et al. Uncooled microbolometer detector: recent developments at ULIS[J]. Opto-Electronics Review, 2006, 14(3): 187-191.

    [10] [10] ZHANG Y, Ashe J, LUO Y, et al. Semiconductor lasers and applications [C]//Proc. of SPIE, 2002, 4913:177-183.

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    ZHOU Bing, HE Xuan, LIU Hexiong, LI Bingxuan, ZHANG Junxiang. Experimental Study on Laser-induced Damage to an Uncooled Microbolometer[J]. Infrared Technology, 2021, 43(1): 1

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    Paper Information

    Category:

    Received: Nov. 25, 2019

    Accepted: --

    Published Online: Apr. 15, 2021

    The Author Email: Bing ZHOU (zhbgxgc@163.com)

    DOI:

    CSTR:32186.14.

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