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Acta Optica Sinica, Volume. 44, Issue 14, 1426001(2024)

Multi-Particle Capture in Tight Focus with Radially Polarized Autofocusing Airy Beam Carrying New Kind of Power-Exponent-Phase Vortex

Xiaoming Zhou1,2,3, Haitao Wang1,3、*, Jinghui Zhang1,3, Chunhong Qiao1,3, and Chengyu Fan1,3
Author Affiliations
  • 1Key Laboratory of Atmospheric Optics, Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, Anhui , China
  • 2Science Island Branch of Graduate School, University of Science and Technology of China, Hefei 230026,Anhui , China
  • 3Advanced Laser Technology Laboratory of Anhui Province, Hefei 230037, Anhui , China
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    Schematic diagram of tight focusing system

    Fig. 1. Schematic diagram of tight focusing system

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    Total focal plane optical intensity and its corresponding longitudinal electric field phase when topological charge number l=2. (a) Total focal plane optical intensity when power index n=2; (b) total focal plane optical intensity when power index n=10; (c) longitudinal electric field phase when power index n=2; (d) longitudinal electric field phase when power index n=10

    Fig. 2. Total focal plane optical intensity and its corresponding longitudinal electric field phase when topological charge number l=2. (a) Total focal plane optical intensity when power index n=2; (b) total focal plane optical intensity when power index n=10; (c) longitudinal electric field phase when power index n=2; (d) longitudinal electric field phase when power index n=10

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    Total focal plane optical intensity and its corresponding longitudinal electric field phase when power index n=2. (a)(c)(e)(g) Total focal plane optical intensity when topological charge number l=4, 6, 8, 10, respectively; (b)(d)(f)(h) longitudinal electric field phase when topological charge number l=4, 6, 8, 10, respectively

    Fig. 3. Total focal plane optical intensity and its corresponding longitudinal electric field phase when power index n=2. (a)(c)(e)(g) Total focal plane optical intensity when topological charge number l=4, 6, 8, 10, respectively; (b)(d)(f)(h) longitudinal electric field phase when topological charge number l=4, 6, 8, 10, respectively

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    Comparison of forces on metal particles in different directions between PEPV beam and autofocusing Airy beam carrying NPEPV. (a)(c)(e) Gradient forces along the x, y, and z directions of the focal plane; (b)(d)(f) scattering and absorption forces along the x, y, and z directions of the focal plane

    Fig. 4. Comparison of forces on metal particles in different directions between PEPV beam and autofocusing Airy beam carrying NPEPV. (a)(c)(e) Gradient forces along the x, y, and z directions of the focal plane; (b)(d)(f) scattering and absorption forces along the x, y, and z directions of the focal plane

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    Comparison of forces on microbubbles in different directions between PEPV beam and autofocusing Airy beam carrying NPEPV. (a)(c)(e) Gradient forces along the x, y, and z directions of the focal plane; (b)(d)(f) scattering and absorption forces along the x, y, and z directions of the focal plane

    Fig. 5. Comparison of forces on microbubbles in different directions between PEPV beam and autofocusing Airy beam carrying NPEPV. (a)(c)(e) Gradient forces along the x, y, and z directions of the focal plane; (b)(d)(f) scattering and absorption forces along the x, y, and z directions of the focal plane

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    Total focal plane optical intensity when power index n=2 and topological charge number l=4, numbers 1-4 correspond to the sequence numbers of nearby dark nuclei, respectively

    Fig. 6. Total focal plane optical intensity when power index n=2 and topological charge number l=4, numbers 1-4 correspond to the sequence numbers of nearby dark nuclei, respectively

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    Forces on microbubbles at four dark cores and different directions between PEPV beam and autofocusing Airy beam carrying NPEPV. (a)(c)(e) Gradient forces along the x, y, and z directions of the focal plane; (b)(d)(f) scattering and absorption forces along the x, y, and z directions of the focal plane

    Fig. 7. Forces on microbubbles at four dark cores and different directions between PEPV beam and autofocusing Airy beam carrying NPEPV. (a)(c)(e) Gradient forces along the x, y, and z directions of the focal plane; (b)(d)(f) scattering and absorption forces along the x, y, and z directions of the focal plane

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    Total focal plane optical intensity when power index n=2. (a) Topological charge number l=2; (b) topological charge number l=4, the straight lines j, s, d, t, and q represent the weakest direction of the optical intensity at the light wall around the dark nucleus, respectively

    Fig. 8. Total focal plane optical intensity when power index n=2. (a) Topological charge number l=2; (b) topological charge number l=4, the straight lines j, s, d, t, and q represent the weakest direction of the optical intensity at the light wall around the dark nucleus, respectively

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    • Table 1. Three-dimensional R-values at different dark core locations

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      Table 1. Three-dimensional R-values at different dark core locations

      Dark coreR in the x-directionR in the y-directionR in the z-direction
      Dark core 115561312639
      Dark core 213181556639
      Dark core 315511318639
      Dark core 413121551639

    • Table 2. Lateral and axial Rthermal values for different captured particles

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      Table 2. Lateral and axial Rthermal values for different captured particles

      TypeLateral RthermalAxial Rthermal
      Metal particle2.2318056×10-597.133942×10-125
      Microbubble1.0172385×10-347.324814×10-35
      Four microbubbles4.9650319×10-74.437577×10-20
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    Xiaoming Zhou, Haitao Wang, Jinghui Zhang, Chunhong Qiao, Chengyu Fan. Multi-Particle Capture in Tight Focus with Radially Polarized Autofocusing Airy Beam Carrying New Kind of Power-Exponent-Phase Vortex[J]. Acta Optica Sinica, 2024, 44(14): 1426001

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    Paper Information

    Category: Physical Optics

    Received: Jan. 18, 2024

    Accepted: Apr. 7, 2024

    Published Online: Jul. 4, 2024

    The Author Email: Wang Haitao (htwang@aiofm.ac.cn)

    DOI:10.3788/AOS240523

    CSTR:32393.14.AOS240523

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology