Laser & Optoelectronics Progress, Volume. 56, Issue 9, 091501(2019)

Machine-Vision Based Defect Detection Algorithm for Packaging Bags

Dan Li*, Guojun Bai, Yuanyuan Jin, and Yan Tong
Author Affiliations
  • Department of Information and Control Engineering, Shenyang Urban Construction University, Shenyang, Liaoning 110167, China
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    References(14)

    [2] Tan H[J]. Thoughts on the relationship between emotional design and packaging culture Art Education Research, 2016, 39-40.

    [10] Wang Q. Research and application of detection and recognition system based on machine vision[D]. Chengdu: University of Electronic Science and Technology of China, 2(2010).

    [13] Wang Q F. Design and implementation of label defect detection system based on machine vision[D]. Chengdu: University of Electronic Science and Technology of China, 40-41(2014).

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    Dan Li, Guojun Bai, Yuanyuan Jin, Yan Tong. Machine-Vision Based Defect Detection Algorithm for Packaging Bags[J]. Laser & Optoelectronics Progress, 2019, 56(9): 091501

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    Paper Information

    Category: Machine Vision

    Received: Oct. 10, 2018

    Accepted: Nov. 22, 2018

    Published Online: Jul. 5, 2019

    The Author Email: Dan Li (247573549@qq.com)

    DOI:10.3788/LOP56.091501

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