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Laser & Optoelectronics Progress, Volume. 61, Issue 10, 1012004(2024)

Visual Detection Method of Optical Lens Surface Defect Under Dual Light Sources

Shunqin Xu, Lihong Yang*, Qinyue Fu, Qianxi Chen, Xingyuan Li, and Hang Ge
Author Affiliations
  • College of Photoelectric Engineering, Xi'an Technological University, Xi'an, 710021, Shaanxi, China
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    AbstractGet PDF(in Chinese)
    Figures&Tables (11)
    Equations (2)
    References (17)
    Cited By (1)
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    Figures & Tables(11)
    Structure of the critical defect detection device

    Fig. 1. Structure of the critical defect detection device

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    Images acquired from the lenses under different illumination. (a) Surface image collected under forward light; (b) surface image collected under backlight

    Fig. 2. Images acquired from the lenses under different illumination. (a) Surface image collected under forward light; (b) surface image collected under backlight

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    Telecentric lens imaging features

    Fig. 3. Telecentric lens imaging features

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    Two light source illumination modes. (a) Ring-light source illumination mode; (b) parallel backlight source illumination mode

    Fig. 4. Two light source illumination modes. (a) Ring-light source illumination mode; (b) parallel backlight source illumination mode

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    Flow chart of image processing

    Fig. 5. Flow chart of image processing

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    Images acquired from optical lenses under different light sources. (a) Forward light defect image; (b) backlight defect image

    Fig. 6. Images acquired from optical lenses under different light sources. (a) Forward light defect image; (b) backlight defect image

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    Preprocessed defect images. (a) Defects identified in forward light; (b) defects identified in backlight; (c) defects identified after image fusion

    Fig. 7. Preprocessed defect images. (a) Defects identified in forward light; (b) defects identified in backlight; (c) defects identified after image fusion

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    • Table 1. Calibration parameters

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      Table 1. Calibration parameters

      Calibration parameters of the imaging system
      A single pixel wide（Sx）/μm3.44961Center point y coordinates（Cy）/pixel1024.02
      A single pixel high（Sy）/μm3.45Medium image wide /pixel2448
      Magnification /times0.801082Medium image high /pixel2048
      X rotation direction /（°）357.985Y rotation direction /（°）358.914
      Center point x coordinates（Cx）/pixel1223.81Z rotation direction /（°）3.24858

    • Table 2. Error analysis

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      Table 2. Error analysis

      NumberDefectZYGO interferometer /μmSystem test /μmError ratio /%
      WidthDiameterWidthDiameter
      1Pitting—17.484—17.6951.206
      2Pitting—7.596—7.3942.659
      3Pitting—42.325—41.9750.826
      4Pitting—53.235—53.2970.116
      5Pitting—96.533—96.5050.029
      6Scratch8.412—8.430—0.214
      7Scratch15.196—15.303—0.704
      8Scratch28.495—28.551—0.196
      9Scratch37.623—37.627—0.011
      10Scratch67.769—67.892—0.181

    • Table 3. Lens defect detection results

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      Table 3. Lens defect detection results

      Detection methodTotal number of defectNumber of pitingNumber of scratch
      Forward light detection15510
      Backlight detection1486
      Image fusion detection251312

    • Table 4. Comparison among system detection results, ZYGO detection results and manual detection results

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      Table 4. Comparison among system detection results, ZYGO detection results and manual detection results

      Detection methodScratch maximum width /μmScratch minimum width /μmPiting maximum diameter /μmPiting minimum diameter /μmTime /s
      System713.80823.80063.29734.0355.327
      ZYGO713.62524.57563.39834.021304.000
      Manual710.00030.00060.00030.000—
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    Shunqin Xu, Lihong Yang, Qinyue Fu, Qianxi Chen, Xingyuan Li, Hang Ge. Visual Detection Method of Optical Lens Surface Defect Under Dual Light Sources[J]. Laser & Optoelectronics Progress, 2024, 61(10): 1012004

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Sep. 11, 2023

    Accepted: Oct. 13, 2023

    Published Online: Mar. 20, 2024

    The Author Email: Lihong Yang (yanglihong@xatu.edu.cn)

    DOI:10.3788/LOP232084

    CSTR:32186.14.LOP232084

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology