INFRARED, Volume. 45, Issue 3, 1(2024)
Study on Variable Junction Area I-V Test of Molecular-Beam-Epitaxy Mercury Cadmium Telluride Detectors
[1] [1] RogalskiA.Infrared Detectors (2ndEdition)[M].BocaRaton:CRCPress,2011.
[4] [4] WijewarnasuriyaP,YooS,FaurieJ,etal.PTypeDoping with Arsenicin (211)B HgCdTe GrownbyMBE[J].JournalofElectronicMaterials,1996,175--176(8):1300--1305.
[5] [5] KumarV,PalR,ChaudhuryPK,etal.ACdTe PassivationProcessforLongWavelengthInfrared HgcdtePhoto-Detectors [J].Journalof ElectronicMaterials,2005,34(9):1225--1229.
[8] [8] VishnuGopal.Variable-areaDiodeDataAnalysis ofSurfaceandBulkEffectsinHgCdTePhotodetector Arrays [J].SemiconductorScienceand Technology ,1994,9:2267--2271.
[9] [9] VishnuGopal.AGeneralRelationBetweenZerobiasResistance-areaProductandPerimeter-to-area RatiooftheDiodesin Variable-areaDiodeTest Structures[J].SemiconductorScienceandTechnology,1996,11:1070--1076.
[10] [10] XieX,HuaH,QiuG,etal.StudyoftheCharacteristicsofVLWIRHgCdTePhotovoltaicDetectorsinVariable-areaDiodeTestStructures[C].SPIE,2011,8193:819335.
[11] [11] LiQ,MaW Q,ZhangYH,etal.DarkCurrent MechanismofUnpassivatedMidWavelengthType IIInAs/GaSbSuperlatticeInfraredPhotodetector[J].ChineseScience Bulletin,2014,59(28):3696--3700.
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ZHAO Cheng-cheng, WANG Dan, HE Bin, DAI Yong-xi. Study on Variable Junction Area I-V Test of Molecular-Beam-Epitaxy Mercury Cadmium Telluride Detectors[J]. INFRARED, 2024, 45(3): 1
Received: Nov. 2, 2023
Accepted: --
Published Online: Sep. 29, 2024
The Author Email: ZHAO Cheng-cheng (chchzhao.ucas@139.com)