Chinese Journal of Lasers, Volume. 52, Issue 17, 1704003(2025)
Robust Total Least‑Squares Estimator for Registration of Laser Tracker During Changing Measuring Station
Fig. 2. Absolute bias of 100 Monte Carlo simulations under different contamination modes. (a)(d)
Fig. 3. Registration accuracy of 100 Monte Carlo simulations under different contamination modes
|
|
|
|
|
Get Citation
Copy Citation Text
Zhipeng Lü, Wei Wang, Yelong Wei. Robust Total Least‑Squares Estimator for Registration of Laser Tracker During Changing Measuring Station[J]. Chinese Journal of Lasers, 2025, 52(17): 1704003
Category: Measurement and metrology
Received: Mar. 20, 2025
Accepted: May. 9, 2025
Published Online: Sep. 17, 2025
The Author Email: Yelong Wei (wylong@ustc.edu.cn)
CSTR:32183.14.CJL250623