Chinese Optics Letters, Volume. 9, Issue 7, 071201(2011)

Development of a low-cost measurement system for cutting edge profile detection

Gregor Gerstorfer and Bernhard G. Zagar
Author Affiliations
  • Institute for Measurement Technology, Johannes Kepler University, Altenbergerstrasse 69, 4040 Linz, Austria
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    References(5)

    [1] [1] K.-Ch. Fan, Ch.-L. Chu, and J.-I Mou, Meas. Sci. Tech. 12, 2137 (2001)

    [2] [2] E.-T. Hwu, K.-Y. Huang, S.-K. Hung, and I.-S. Hwang, Jpn. J. Appl. Phys. 45, 2368 (2006)

    [3] [3] S. Kostner and M. J. Vellekoop, Elektrotechnik und Informationstechnik 125, 98 (2008)

    [4] [4] N. Islam, R. Parkin, and P. Mueller, in Proceedings of 10th International Conference on Mechatronics Technology (ICMT2006) 203 (2006)

    [5] [5] K.-C. Fan, C.-L. Chu, J.-L. Mou, and J.-I. Mou, Mea. Sci. Tech. 14, 47 (2002)

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    Gregor Gerstorfer, Bernhard G. Zagar, "Development of a low-cost measurement system for cutting edge profile detection," Chin. Opt. Lett. 9, 071201 (2011)

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    Paper Information

    Category: Instrumentation, measurement, and metrology

    Received: Dec. 9, 2010

    Accepted: Feb. 18, 2011

    Published Online: May. 13, 2011

    The Author Email:

    DOI:10.3788/COL201109.071201

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