Journals Articles Conferences News About CLP
Submit a paper Email Alert
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
2D MaterialsTransformation opticsQuantum PhotonicsSmall lasersSemiconductor UV PhotonicsSupersymmetric microring laser arrays

Laser & Infrared, Volume. 54, Issue 11, 1694(2024)

Dynamic excitation-based internal defect detection in 3D packaging

NIE Lei1, ZHANG Ming1, YU Chen-rui1, and LUO Ren-xing2
Author Affiliations
  • 1School of Mechanical Engineering, Hubei University of Technology, Wuhan 430068, China
  • 2Hubei Taihe Electric Co., Ltd., Xiangyang 441057, China
    • show less
    AbstractGet PDF(in Chinese)
    Figures&Tables (0)
    Equations (0)
    References (13)
    Tools
    Paper Information
    Topics
    Figures & Tables(0)
    Tools

    Get Citation

    Copy Citation Text

    NIE Lei, ZHANG Ming, YU Chen-rui, LUO Ren-xing. Dynamic excitation-based internal defect detection in 3D packaging[J]. Laser & Infrared, 2024, 54(11): 1694

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Set citation alerts for article
    Save article for my favorites
    Paper Information

    Category:

    Received: Feb. 4, 2024

    Accepted: Jan. 14, 2025

    Published Online: Jan. 14, 2025

    The Author Email:

    DOI:10.3969/j.issn.1001-5078.2024.11.007

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology