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Advanced Photonics Nexus, Volume. 2, Issue 4, 046005(2023)

Untrained neural network enhances the resolution of structured illumination microscopy under strong background and noise levels

Yu He1、†, Yunhua Yao1, Yilin He1, Zhengqi Huang1, Dalong Qi1, Chonglei Zhang2, Xiaoshuai Huang3, Kebin Shi4, Pengpeng Ding1, Chengzhi Jin1, Lianzhong Deng1, Zhenrong Sun1, Xiaocong Yuan2、*, and Shian Zhang1,5,6、*
Author Affiliations
  • 1East China Normal University, School of Physics and Electronic Science, State Key Laboratory of Precision Spectroscopy, Shanghai, China
  • 2Shenzhen University, Institute of Microscale Optoelectronics, Nanophotonics Research Center, Shenzhen Key Laboratory of Micro-Scale Optical Information Technology, Shenzhen, China
  • 3Peking University, Biomedical Engineering Department, Beijing, China
  • 4Peking University, School of Physics, State Key Laboratory for Mesoscopic Physics and Frontiers Science Center for Nano-optoelectronics, Beijing, China
  • 5East China Normal University, Joint Research Center of Light Manipulation Science and Photonic Integrated Chip of East China Normal University and Shandong Normal University, Shanghai, China
  • 6Shanxi University, Collaborative Innovation Center of Extreme Optics, Taiyuan, China
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    Yu He, Yunhua Yao, Yilin He, Zhengqi Huang, Dalong Qi, Chonglei Zhang, Xiaoshuai Huang, Kebin Shi, Pengpeng Ding, Chengzhi Jin, Lianzhong Deng, Zhenrong Sun, Xiaocong Yuan, Shian Zhang, "Untrained neural network enhances the resolution of structured illumination microscopy under strong background and noise levels," Adv. Photon. Nexus 2, 046005 (2023)

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    Paper Information

    Category: Research Articles

    Received: Feb. 10, 2023

    Accepted: Jun. 14, 2023

    Published Online: Jul. 7, 2023

    The Author Email: Xiaocong Yuan (xcyuan@szu.edu.cn), Shian Zhang (sazhang@phy.ecnu.edu.cn)

    DOI:10.1117/1.APN.2.4.046005

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology