Microelectronics, Volume. 51, Issue 3, 424(2021)
Analysis of Factors Affecting the Flatness of On-Resistance for 30 V UMOS
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ZHOU Xi, FENG Quanyuan. Analysis of Factors Affecting the Flatness of On-Resistance for 30 V UMOS[J]. Microelectronics, 2021, 51(3): 424
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Received: Aug. 20, 2020
Accepted: --
Published Online: Mar. 11, 2022
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