Fig. 1. Schematic diagram of EBAPS operation

Fig. 2. EBAPS non-uniformity noise introduction path diagram

Fig. 3. Output image of EBAPS

Fig. 4. Imaging effects of non-uniformity in practical applications

Fig. 5. Non-uniform noise introduced by electronically sensitive CMOS

Fig. 6. Non-uniform noise introduced by electron bombardment

Fig. 7. Average grayscale and 3D grayscale distribution diagram

Fig. 8. Non-uniformity of EBAPS devices under different illuminance and voltage conditions

Fig. 9. Effect of bombardment voltage on non-uniformity of EBAPS imaging

Fig. 10. EBAPS device image non-uniformity testing system