Intensifying process of polarization ef fect within pixellated CdZnTe detectors for X-ray imaging

Xi Wang; Shali Xiao; Miao Li; Liuqiang Zhang; Yulin Cao; Yuxiao Chen

doi:10.3788/COL201109.070401

Chinese Optics Letters, Volume. 9, Issue 7, 070401(2011)

Intensifying process of polarization ef fect within pixellated CdZnTe detectors for X-ray imaging

Xi Wang¹, Shali Xiao¹, Miao Li¹, Liuqiang Zhang¹, Yulin Cao², and Yuxiao Chen²

¹Key Laboratory of Optoelectronic Technology and Systems, Ministry of Education, Chongqing University, Chongqing 400030, China

²Institute of Electronic Engineering, China Academy of Engineering Physics, Mianyang 621900, China

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Xi Wang, Shali Xiao, Miao Li, Liuqiang Zhang, Yulin Cao, Yuxiao Chen, "Intensifying process of polarization ef fect within pixellated CdZnTe detectors for X-ray imaging," Chin. Opt. Lett. 9, 070401 (2011)

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Paper Information

Category: Detectors

Received: Jan. 7, 2011

Accepted: Feb. 21, 2011

Published Online: May. 18, 2011

The Author Email:

DOI:10.3788/COL201109.070401

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology