Real-time, <i>in situ</i> probing of gamma radiation damage with packaged integrated photonic chips

Qingyang Du; Jérôme Michon; Bingzhao Li; Derek Kita; Danhao Ma; Haijie Zuo; Shaoliang Yu; Tian Gu; Anuradha Agarwal; Mo Li; Juejun Hu

doi:10.1364/PRJ.379019

Photonics Research, Volume. 8, Issue 2, 186(2020)

Real-time, in situ probing of gamma radiation damage with packaged integrated photonic chips

Qingyang Du¹, Jérôme Michon¹, Bingzhao Li², Derek Kita¹, Danhao Ma¹, Haijie Zuo¹, Shaoliang Yu¹, Tian Gu¹, Anuradha Agarwal¹, Mo Li^2,3, and Juejun Hu^1、*

Author Affiliations

¹Department of Materials Science & Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA

²Department of Electrical and Computer Engineering, University of Washington, Seattle, Washington 98195, USA

³Department of Physics, University of Washington, Seattle, Washington 98195, USA

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Qingyang Du, Jérôme Michon, Bingzhao Li, Derek Kita, Danhao Ma, Haijie Zuo, Shaoliang Yu, Tian Gu, Anuradha Agarwal, Mo Li, Juejun Hu, "Real-time, in situ probing of gamma radiation damage with packaged integrated photonic chips," Photonics Res. 8, 186 (2020)

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Paper Information

Category: Silicon Photonics

Received: Oct. 2, 2019

Accepted: Dec. 3, 2019

Published Online: Feb. 10, 2020

The Author Email: Juejun Hu (hujuejun@mit.edu)

DOI:10.1364/PRJ.379019

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology