Current-voltage characteristics simulation and analysis of 4H-SiC metal-semiconductor-metal ultraviolet photodetectors

Junqin Zhang; Yintang Yang; Lifei Lou; Yan Zhao

doi:10.3788/COL20080608.0615

Chinese Optics Letters, Volume. 6, Issue 8, 615(2008)

Current-voltage characteristics simulation and analysis of 4H-SiC metal-semiconductor-metal ultraviolet photodetectors

Junqin Zhang, Yintang Yang, Lifei Lou, and Yan Zhao

School of Microelectronics, Xidian University, Key Lab of Ministry of Education for Wide Bandgap Semiconductor Materials and Devices, Xi'an 710071

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Junqin Zhang, Yintang Yang, Lifei Lou, Yan Zhao, "Current-voltage characteristics simulation and analysis of 4H-SiC metal-semiconductor-metal ultraviolet photodetectors," Chin. Opt. Lett. 6, 615 (2008)

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Paper Information

Received: Dec. 26, 2007

Accepted: --

Published Online: Sep. 2, 2008

The Author Email:

DOI:10.3788/COL20080608.0615

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology