Acta Optica Sinica, Volume. 21, Issue 10, 1177(2001)
Atomic Force Microscope Study of the Structure of Short-Wavelength Laser Static Recording Bits in TeOx Thin Film
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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Atomic Force Microscope Study of the Structure of Short-Wavelength Laser Static Recording Bits in TeOx Thin Film[J]. Acta Optica Sinica, 2001, 21(10): 1177
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