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Chinese Optics Letters, Volume. 15, Issue 5, 053101(2017)

Simultaneous measurements of s- and p-polarization reflectivity with a cavity ring-down technique employing no polarization optics

Hao Cui1,2, Bincheng Li1,2、*, Yanling Han2, Jing Wang1, Chunming Gao1, and Yafei Wang1
Author Affiliations
  • 1School of Optoelectronic Information, University of Electronic Science and Technology of China, Chengdu 610054, China
  • 2Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China
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    [1] Kesheng Guo, Yanzhi Wang, Ruiyi Chen, Meiping Zhu, Kui Yi, Hongbo He, Jianda Shao. Effects of structural defects on laser-induced damage of 355-nm high-reflective coatings sputtered on etched substrates. Optical Materials, 89, 173(2019).

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    Hao Cui, Bincheng Li, Yanling Han, Jing Wang, Chunming Gao, Yafei Wang, "Simultaneous measurements of s- and p-polarization reflectivity with a cavity ring-down technique employing no polarization optics," Chin. Opt. Lett. 15, 053101 (2017)

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    Paper Information

    Category: Thin films

    Received: Dec. 4, 2016

    Accepted: Feb. 10, 2017

    Published Online: Jul. 23, 2018

    The Author Email: Bincheng Li (bcli@uestc.edu.cn)

    DOI:10.3788/COL201715.053101

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology