Laser & Optoelectronics Progress, Volume. 58, Issue 24, 2432001(2021)

Brightness Characteristics and Fractal Dimension of Spot Ablated by Femtosecond Laser

Fubin Wang and Zhilin Sun*
Author Affiliations
  • School of Electrical Engineering, North China University of Science and Technology, Tangshan, Hebei 063210, China
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    Figures & Tables(14)
    Spot sequence image
    Reverse order continuation of the image. (a) Original image; (b) arrange the columns of the original image in reverse order; (c) combined image of Fig. 2 (a) and Fig. 2 (b); (d) arrange the rows in Fig. 2 (c) in reverse order; (e) image after extension
    Schematic diagram of the threshold function. (a) Hard threshold function; (b) soft threshold function
    Spot effects obtained by different methods. (a) Original spot image; (b) hard threshold denoising method; (c) soft threshold denoising method; (d) our method
    Segmentation results of K-means clustering method. (a) Preprocessed image; (b) halo and plasma dissipated part; (c) effective area of the spot
    Spot image and gray-scale distribution after processing by different methods. (a) Original spot image; (b) preprocessed image; (c) segmented spot image
    Brightness characteristic change curve of spot sequence images
    Brightness change curves of different ablation intervals. (a) 500--600 frame; (b) 1400--1500 frame
    Brightness change curves extracted by different methods. (a) 500--600 frame; (b) 1400--1500 frame
    Denoising results of different methods. (a) 500--600 frame; (b) 1400--1500 frame
    Processing result of the combination of fractal and multi-scale soft threshold denoising. (a) 500--600 frame; (b) 1400--1500 frame
    Shape of the spot during the movement of the processing platform. (a) Movement process from right to left; (b) spot shape at the far right end; (c) movement process from left to right; (d) spot shape at the far left end
    Analysis of brightness and complexity of different power light spots
    • Table 1. Ablation experimental parameters of silicon microchannels

      View table

      Table 1. Ablation experimental parameters of silicon microchannels

      Number of groovesAblation power /mWAverage slot depth /μm
      391023
      3950108
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    Fubin Wang, Zhilin Sun. Brightness Characteristics and Fractal Dimension of Spot Ablated by Femtosecond Laser[J]. Laser & Optoelectronics Progress, 2021, 58(24): 2432001

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    Paper Information

    Category: Ultrafast Optics

    Received: Nov. 30, 2020

    Accepted: Dec. 17, 2020

    Published Online: Dec. 3, 2021

    The Author Email: Zhilin Sun (szl15613567396@163.com)

    DOI:10.3788/LOP202158.2432001

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