Acta Optica Sinica, Volume. 38, Issue 4, 0412003(2018)

Fast Quantitative Parallax Test Based on Sine-Like Micrometric Method

Jin Niu1,2, Xiping Xu1、*, Shu Wang2, and Zhiyong An1
Author Affiliations
  • 1 School of Opto-Electronic Engineering, Changchun University of Science and Technology, Changchun, Jilin 130114, China
  • 2 Key Laboratory of Transient Impact Technology, Beijing 102200, China
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    Jin Niu, Xiping Xu, Shu Wang, Zhiyong An. Fast Quantitative Parallax Test Based on Sine-Like Micrometric Method[J]. Acta Optica Sinica, 2018, 38(4): 0412003

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Aug. 21, 2017

    Accepted: --

    Published Online: Jul. 10, 2018

    The Author Email: Xu Xiping (xxp@cust.edu.cn)

    DOI:10.3788/AOS201838.0412003

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