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Laser & Optoelectronics Progress, Volume. 55, Issue 11, 110402(2018)

Effect of Detector Nonlinear Response on Visibility Lidar

Tianwen Wei1,2、**, Chong Wang1,2, Mingjia Shangguan1,2, Xiang Shang1,2, and Haiyun Xia1,2、*
Author Affiliations
  • 1 School of Earth and Space Science, University of Science and Technology of China, Hefei, Anhui 230026, China
  • 2 Key Laboratory of Geospace Environment, Chinese Academy of Sciences, Hefei, Anhui 230026, China
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    Acquisition system of experimental data

    Fig. 1. Acquisition system of experimental data

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    Schematic of echo signal calibration. (a) Raw echo signal; (b) calibration principle; (c) response curve; (d) calibration factor

    Fig. 2. Schematic of echo signal calibration. (a) Raw echo signal; (b) calibration principle; (c) response curve; (d) calibration factor

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    Retrieval results of visibility. (a) Visibility obtained by different ways; (b) deviation from that from visibility sensor

    Fig. 3. Retrieval results of visibility. (a) Visibility obtained by different ways; (b) deviation from that from visibility sensor

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    • Table 1. Key parameters of system

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      Table 1. Key parameters of system

      ParameterValue
      Wavelength /nm532
      Pulse energy /mJ15
      Pulse duration /ns7
      Pulse repetition rate /Hz50
      Collimator aperture /mm80
      Telescope aperture /mm300
      Detector dark count /Hz100
      Detector count linearity /MHz1.5
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    Tianwen Wei, Chong Wang, Mingjia Shangguan, Xiang Shang, Haiyun Xia. Effect of Detector Nonlinear Response on Visibility Lidar[J]. Laser & Optoelectronics Progress, 2018, 55(11): 110402

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    Paper Information

    Category: Detectors

    Received: May. 1, 2018

    Accepted: May. 29, 2018

    Published Online: Aug. 14, 2019

    The Author Email: Tianwen Wei (twwei@mail.ustc.edu.cn), Haiyun Xia (hsia@ustc.edu.cn)

    DOI:10.3788/LOP55.110402

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology