Acta Photonica Sinica, Volume. 52, Issue 12, 1212004(2023)

Topography Measurement of Strongly Reflective Surfaces Based on Improved Automatic Multi-exposure and Digital Raster Projection Technology

Jingfa LEI1,2, Yin SUN1,2, Miao ZHANG1,2、*, Yongling LI1,3, Ruhai ZHAO1,2, and Hong SUN1,2
Author Affiliations
  • 1School of Mechanical and Electrical Engineering,Anhui Jianzhu University,Hefei 230601,China
  • 2Key Laboratory of Intelligent Manufacturing of Construction Machinery,Anhui Education Department,Hefei 230601,China
  • 3Sichuan Provincial Key Laboratory of Process Equipment and Control Engineering,Zigong 643000,China
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    Jingfa LEI, Yin SUN, Miao ZHANG, Yongling LI, Ruhai ZHAO, Hong SUN. Topography Measurement of Strongly Reflective Surfaces Based on Improved Automatic Multi-exposure and Digital Raster Projection Technology[J]. Acta Photonica Sinica, 2023, 52(12): 1212004

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Apr. 24, 2023

    Accepted: Jul. 20, 2023

    Published Online: Feb. 19, 2024

    The Author Email: Miao ZHANG (miao@ahjzu.edu.cn)

    DOI:10.3788/gzxb20235212.1212004

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