[1] [1] A. H. Gnauck and P. J. Winzer, J. Lightwave Technol. 23, 115 (2005).

[2] [2] H. Wen, J. Liao, X. Zheng, and H. Zhang, Chin. Opt. Lett. 9, 100607 (2011).

[3] [3] H. Kim and P. J. Winzer, J. Lightwave Technol. 21, 1887 (2003).

[4] [4] K.-P. Ho, IEEE Photon. Technol. Lett. 16, 308 (2004).

[5] [5] F. Seguin and F. Gonthier, in Proceedings of OFC2005 OFL5 (2005).

[6] [6] H. Haunstein and R. Schlenk, "Control of Delay Line Interferometer" U.S. Patent 7266311 (2007).

[7] [7] J. Li, K. Worms, D. Hillerkuss, B. Richter, R. Maestle, W. Freude, and J. Leuthold, in Proceedings of OFC2010 JWA24 (2010).

[8] [8] J. Li, K. Worms, R. Maestle, D. Hillerkuss, W. Freude, and J. Leuthold, Opt. Express 19, 11654 (2011).

[9] [9] H. Kawakami, E. Yoshida, Y. Miyamoto, M. Oguma, and T. Itoh, Electron. Lett. 44, 437 (2008).

[10] [10] L. Christen, S. Nuccio, Y. K. Lize, N. Jayachandran, A. E. Willner, and L. Parschis, in Proceedings of CLEO2007 CMJJ2 (2007).

[11] [11] H. C. Ji, P. K. J. Park, H. Kim, J. H. Lee, and Y. C. Chung, IEEE Photon. Technol. Lett. 18, 950 (2006).

[12] [12] J. Zhao, A. P. T. Lau, C. Lu, H. Y. Tam, and P. K. A. Wai, IEEE Photon. Technol. Lett. 22, 1018 (2010).

[13] [13] H. Wen, Y. Ge, H. Jiang, L. Han, X. Chen, X. Zheng, H. Zhang, and Y. Guo, Proc. SPIE 7136, 713636 (2008).

[14] [14] M. S. Alfiad, D. van den Borne, F. N. Huaske, A. Napoli, A. M. J. Koonen, and H. de Waardt, J. Lightwave Technol. 27, 4583 (2009).