Characterization Analysis of Micro‑defects in Thin‑Film Components for Laser Systems

Yun Cui; Ge Zhang; Yuanan Zhao; Yuchuan Shao; Meiping Zhu; Kui Yi; Jianda Shao

doi:10.3788/CJL220568

Chinese Journal of Lasers, Volume. 50, Issue 2, 0203101(2023)

Characterization Analysis of Micro‑defects in Thin‑Film Components for Laser Systems

Yun Cui^1,2、*, Ge Zhang^1,2, Yuanan Zhao^1,2, Yuchuan Shao^1,2, Meiping Zhu^1,2, Kui Yi^1,2, and Jianda Shao^1,2、**

¹Laboratory of Thin Film Optics, Shanghai Institute of Optics and Fine Mechanics,Chinese Academy of Sciences, Shanghai 201800, China

²Key Laboratory of Materials for High Power Laser, Chinese Academy of Sciences, Shanghai 201800, China

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Yun Cui, Ge Zhang, Yuanan Zhao, Yuchuan Shao, Meiping Zhu, Kui Yi, Jianda Shao. Characterization Analysis of Micro‑defects in Thin‑Film Components for Laser Systems[J]. Chinese Journal of Lasers, 2023, 50(2): 0203101

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Paper Information

Category: Thin Films

Received: Feb. 14, 2022

Accepted: May. 6, 2022

Published Online: Feb. 7, 2023

The Author Email: Cui Yun (cuiyun@siom.ac.cn), Shao Jianda (jdshao@mail.shcnc.ac.cn)

DOI:10.3788/CJL220568

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology