Chinese Journal of Lasers, Volume. 30, Issue 4, 345(2003)

Investigations on the Relations between Crystal Structure and Electrical Properties of ZrO2 Thin Films

[in Chinese]*, [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Investigations on the Relations between Crystal Structure and Electrical Properties of ZrO2 Thin Films[J]. Chinese Journal of Lasers, 2003, 30(4): 345

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    Paper Information

    Category: materials and thin films

    Received: Jan. 28, 2002

    Accepted: --

    Published Online: Jun. 27, 2006

    The Author Email: (ninglinzhang@mail.sim.ac.cn)

    DOI:

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