Acta Optica Sinica, Volume. 41, Issue 17, 1726001(2021)
Influencing Factors and Improved Methods of Spatial Resolution of Focused Refractive Index Microscopy Imaging System
Fig. 1. Polarization selective absorption properties of graphene under total internal reflection conditions. (a) Schematic of sandwich structure containing graphene; (b) reflectivity curves of TE polarized light and TM polarized light
Fig. 2. 45° generalized column vector incident light focusing. (a) Polarization schematic diagram; (b) intensity of longitudinal electric field component; (c) intensity of radial electric field component; (d) intensity of angular electric field component; (e) width at diameter of radial electric field beam; (f) width at diameter of angular electric field beam
Fig. 6. Refractive index curves measured at diameter of ball scanned by different beams. (a) Refractive index curve measured at diameter of ball scanned by slim beam; (b) refractive index curve measured at diameter of ball scanned by 45° generalized cylindrical vector beam
Fig. 7. Deconvolution and theoretical simulation results. (a) Simulation results of ideal slim beam and generalized column vector beam sweeping over small ball 2; (b) result of ball 2 after eliminating influence of wide beam
Fig. 9. Characterization diagram of PS beads. (a) Microscope characterization diagram; (b) Coulter characterization diagram
Fig. 10. Result of optical system scanning 1st PS ball. (a) Bright field diagram under optical system; (b) refractive index distribution obtained by scanning 1st PS ball
Fig. 11. Deconvolution results of ball experiment. (a) Refractive index distribution obtained by scanning 2nd PS ball by optical system; (b) refractive index distribution of PS ball after one-dimensional transverse deconvolution; (c) refractive index distribution of PS ball after two-dimensional transverse and longitudinal deconvolution; (d) refractive index curves measured at diameter of PS ball recovered by deconvolution
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Yizhe Yang, Zhongfa Liu, Yu Fang, Xiaojing Wu, Yong Yang, Siwei Zhu. Influencing Factors and Improved Methods of Spatial Resolution of Focused Refractive Index Microscopy Imaging System[J]. Acta Optica Sinica, 2021, 41(17): 1726001
Category: Physical Optics
Received: Jan. 25, 2021
Accepted: Mar. 23, 2021
Published Online: Sep. 3, 2021
The Author Email: Wu Xiaojing (xiaojingwu@nankai.edu.cn), Yang Yong (yangyong@nankai.edu.cn)