Chinese Journal of Lasers, Volume. 28, Issue 7, 650(2001)

Optical Properties and Static Optical Recording Performance of Ag-In-Te-Sb-O Films Using Short-wavelength Laser

[in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    References(10)

    [1] [1] M. Takenaga, N. Yamada, K. Nishicechi et al.. TeOx thin films for an optical disc memory. J. Appl. Phys., 1983, 54(9):5376~5380

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    [3] [3] M. Takenaga, N. Yamada, S. Ohara et al.. New optical erasable medium using tellurium suboxside thin film. Proc. SPIE, 1983, 420:173~177

    [4] [4] K. Kimura. Optical recording materials based on TeOx films. Jpn. J. Appl. Phys., 1989, 28(5):810~813

    [5] [5] K. Nishiuchi, H. Kitaura, N. Yamada et al.. Dual-layer optical disk with Te-O-Pd phase-change film. Jpn. J. Appl. Phys., 1998, 37(4B):2163~2167

    [6] [6] Y. Ide, M. Harigai, K. Yamada et al.. Phase change erasable optical recording medium. Jpn. Kokai Tokyo Koho JP02235788, 1990, A2:577~580

    [7] [7] J. Tominaga, S. Haratani, K. Uchiyama et al.. New recordable compact disc with inorganic material, AgOx. Jpn. J. Appl. Phys., 1992, 31(9A):2757~2759

    [8] [8] S. Haratani, J. Tominaga, H. Dohi et al.. Property change of AgOx recordable compact disk with various dielectric films. J. Appl. Phys., 1994, 76(2):1297~1300

    [9] [9] Guo-Fu Zhou, Bernardus A. J. Jacobs. High performance media for phase change optical recording. Jpn. J. Appl. Phys., 1998, 38(3B):1625~1628

    [12] [12] H. Iwasaki, M. Harigaya, O. Nonoyama et al.. Completely erasable phase change optical disc II: Application of Ag-In-Sb-Te mixed-phase system for rewritable compact disc compatible with CD-velocity and double CD-velocity. Jpn. J. Appl. Phys., 1993, 32(11B):5241~5247

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Optical Properties and Static Optical Recording Performance of Ag-In-Te-Sb-O Films Using Short-wavelength Laser[J]. Chinese Journal of Lasers, 2001, 28(7): 650

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    Paper Information

    Category: Optical communication

    Received: Mar. 15, 2000

    Accepted: --

    Published Online: Aug. 10, 2006

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