[1] [1] He Qi, Guo Huibin, Wei Junjun, et al.. Deposition of HfO2 thin films on ZnS substrates [J]. Thin Solid Films, 2008, 516(15): 4695-4699.

[2] [2] C C Clark, A H Lettington, S J Wakeham, et al.. A new properties antireflection coating for multispectral ZnS [C]. SPIE, 2001, 4375: 266-274.

[3] [3] D Franta, I Ohlídal, D Petrydes. Optical characterization of TiO2 thin films by the combined method of spectroscopic ellipsometry and spectroscopic photometry [J]. Vacuum, 2005, 80(1): 159-162.

[4] [4] Jia Hongbao, Sun Jinghua, Xu Yao, et al.. Determination of thickness and optical constants of sol-gel derived TiO2 films by combined analysis of transmittance and X-ray reflectivity spectra [J]. Acta Optica Sinica, 2012, 32(8): 0831001

[5] [5] Fan Huanhuan, Zhang Yueguang, Shen Weidong, et al.. Optical properties of Ta2O5 thin films fabricated by atomic layer deposition [J]. Acta Optica Sinica, 2011, 31(10): 1031001.

[6] [6] V H Mudavakkat, V V Atuchin, V N Kruchinin, et al.. Structure, morphology and optical properties of nanocrystalline yttrium oxide (Y2O3) thin films [J]. Optical Materials, 2012, 34(5): 893-900.

[7] [7] W A Odarych. Ellipsometric studies of the features of the formation of HfO2 films on optical glass [J]. J Opt Technol, 2009, 76(5): 306-311.

[8] [8] Y J Sik. Spectroscopic ellipsometry studies on the optical constants of indium thin oxide films deposited under various sputtering conditions [J]. Thin Solid Films, 2004, 467(1): 36-42.

[9] [9] C Guo, M Kong, W Gao, et al.. Simultaneous determination of optical constants, thickness, and surface roughness of thin film from spectrophotometric measurements [J]. Opt Lett, 2013, 38(1): 40-42.

[10] [10] T Buffeteau, B Desbat. Thin-film optical constants determined from infrared reflectance and transmittance measurements [J]. Applied Spectroscopy, 1989, 43(6): 1027-1032.

[11] [11] Harland G Tompkins, Eugene A Irene. Handbook of Ellipsometry [M]. William Andrew: Springer Press, 2005. 159-172.

[12] [12] J A Dobrowolski, R A Kemp. Refinement of optical multilayer systems with different optimization procedures [J]. Appl Opt, 1990, 29(19): 2876-2893.

[13] [13] Liu Huasong, Wang Lishuan, Jiang Chenghui, et al.. Research on the dispersive properties of optical constants of SiO2 films in the visible and infrared regions [J]. Acta Optica Sinica, 2013, 33(10): 1031002.

[14] [14] Y Morimoto, T Igarashi, H Sugahara, et al.. Analysis of gas release from vitreous silica [J]. J Non-Cryst Solids, 1992, 139: 35-46.

[15] [15] P B McGinnis, J E Shelby. Diffusion of water in vitreous silica [J]. J Non-Cryst Solids, 1994, 179: 185-193.

[16] [16] D K MeElfresh, D G Howitt. A structure base model for diffusion in glass and the determination of diffusion constants in silica [J]. J Non-Cryst Solids, 1990, 124: 474-480.

[17] [17] K M Davids, M Tomozawa. An infrared spectroscopic study of water-related species in silica glasses [J]. J Non-Cryst Solids, 1996, 201: 177-198.