Laser & Infrared, Volume. 54, Issue 7, 1157(2024)

Infrared image conversion technology based on improved pix2pix

YE Ming-liang1, SHI Chun-jing1, HAO Yong-ping2、*, and LI Da-Wei1
Author Affiliations
  • 1School of Mechanical Engineering, Shenyang Ligong University, Shenyang 110159, China
  • 2School of Equipment Engineering, Shenyang Ligong University, Shenyang 110159, China
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    References(5)

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    [8] [8] Li Xingji, Liu Chaoming, Yang Jianqun. Synergistic effect of ionization and displacement damage in NPN transistors caused by protons with various energies[J]. IEEE Tran-saction on Nuclear Science, 2015, 62(3): 1375-1382.

    [10] [10] Barnaby H J, Smith S K, Schrimpf R D, et al. Analytical model for proton radiation effects in bipolar devices[J]. IEEE Transaction on Nuclear Science, 2002, 49(6): 2643-2649.

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    YE Ming-liang, SHI Chun-jing, HAO Yong-ping, LI Da-Wei. Infrared image conversion technology based on improved pix2pix[J]. Laser & Infrared, 2024, 54(7): 1157

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    Paper Information

    Category:

    Received: Nov. 15, 2023

    Accepted: Apr. 30, 2025

    Published Online: Apr. 30, 2025

    The Author Email: HAO Yong-ping (yphsit@126.com)

    DOI:10.3969/j.issn.1001-5078.2024.07.024

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