Acta Optica Sinica, Volume. 21, Issue 5, 609(2001)

Phase Indeterminacy in Phase Analysis Methods for Spatial Carrier Fringe Pattern

[in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    References(10)

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    [4] [4] Sansoni G, Biancardi L, Minoni U et al.. A novel, adaptive system for 3-D optical profilometry using a liquid crystal light projector. IEEE Trans. Instrum. Meas., 1994, 43(4):558~565

    [5] [5] Li J, Su H, Su X. Two-frequency grating used in phase-measuring profilometry. Appl. Opt., 1997, 36(1):277~280

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    [8] [8] Gushov V I, Solodkin Y N. Automatic processing of fringe patterns in integer interferometers. Opt. Lasers Engng., 1991, 14(4,5):311~324

    [9] [9] Takeda M, Gu Q, Kinoshita M et al.. Frequency-multiplex Fourier-transform profilometry: a single-shot three-dimensional shape measurement of objects with large height discontinuities and/or surface isolations. Appl. Opt., 1997, 36(22):5347~5354

    [10] [10] Saldner H O, Huntley J M. Temporal phase unwrapping: application to surface profiling of discontinuous objects. Appl. Opt., 1997, 36(13):2770~2775

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Phase Indeterminacy in Phase Analysis Methods for Spatial Carrier Fringe Pattern[J]. Acta Optica Sinica, 2001, 21(5): 609

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Nov. 9, 1999

    Accepted: --

    Published Online: Aug. 10, 2006

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