Chinese Journal of Lasers, Volume. 15, Issue 6, 341(1988)
Simplified calculation method for deviation characteristics of electrostatic biprism in electron holography
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Chen Jianwen. Simplified calculation method for deviation characteristics of electrostatic biprism in electron holography[J]. Chinese Journal of Lasers, 1988, 15(6): 341
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Received: Jan. 9, 1987
Accepted: --
Published Online: Aug. 13, 2012
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CSTR:32186.14.
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